DETECTING AND MEASURING DEFECTS IN WAFER DIE USING GAN AND YOLOV3

Detecting and Measuring Defects in Wafer Die Using GAN and YOLOv3

metal-chastity This research used deep learning methods to develop a set of algorithms to detect die particle defects.Generative adversarial network (GAN) generated natural and realistic images, which improved the ability of you only look once version 3 (YOLOv3) to detect die defects.Then defects were measured based on the bounding boxes predicted

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FEATURES OF THE FORMATION OF CORTICAL ELECTROGENESIS IN PRESCHOOL CHILDREN WITH HYPOXIC LESIONS OF THE CENTRAL NERVOUS SYSTEM

Because of increase in problem states in a large number of newborns, there is a growing need for early diagnosis of brain damage in children who were underwent severe hypoxia who were received prolonged respiratory therapy, Front Roller Screw since perinatal hypoxic ischemia is one of the main causes of brain damage to newborns.This article gives m

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